- 您现在的位置：买卖IC网 > Sheet目录2002 > KAD5512HP-17Q72 (Intersil)IC ADC 12BIT 170MSPS SGL 72-QFN
27
FN6808.3
October 1, 2009
Device Test
The KAD5512HP can produce preset or user defined
patterns on the digital outputs to facilitate in-situ testing. A
static word can be placed on the output bus, or two different
words can alternate. In the alternate mode, the values
defined as Word 1 and Word 2 (as shown in Table 15) are
set on the output bus on alternating clock phases. The test
mode is enabled asynchronously to the sample clock,
therefore several sample clock cycles may elapse before the
data is present on the output bus.
ADDRESS 0XC0: TEST_IO
Bits 7:6 User Test Mode
These bits set the test mode to static (0x00) or alternate
(0x01) mode. Other values are reserved.
The four LSBs in this register (Output Test Mode) determine
the test pattern in combination with registers 0xC2 through
0xC5. Refer to Table 16.
ADDRESS 0XC2: USER_PATT1_LSB
ADDRESS 0XC3: USER_PATT1_MSB
These registers define the lower and upper eight bits,
respectively, of the first user-defined test word.
ADDRESS 0XC4: USER_PATT2_LSB
ADDRESS 0XC5: USER_PATT2_MSB
These registers define the lower and upper eight bits,
respectively, of the second user-defined test word.
TABLE 15. OUTPUT TEST MODES
VALUE
0xC0[3:0]
OUTPUT TEST
MODE
WORD 1
WORD 2
0000
Off
0001
Midscale
0x8000
N/A
0010
Positive Full-Scale
0xFFFF
N/A
0011
Negative Full-Scale
0x0000
N/A
0100
Checkerboard
0xAAAA
0x5555
0101
Reserved
N/A
0110
Reserved
N/A
0111
One/Zero
0xFFFF
0x0000
1000
User Pattern
user_patt1
user_patt2
KAD5512HP
发布紧急采购，3分钟左右您将得到回复。
相关PDF资料
KAD5512P-17Q72
IC ADC 12BIT 170MSPS SGL 72-QFN
KAD5514P-12Q72
IC ADC 14BIT 125MSPS SGL 72-QFN
KAD5610P-25Q72
IC ADC 10BIT 250MSPS DUAL 72-QFN
KAD5612P-17Q72
IC ADC 12BIT 170MSPS DUAL 72-QFN
LA72715NV-TLM-E
IC AUDIO DECODER JPN MTS 24SSOP
LICAL-DEC-LS001
IC DECODER LOW SECURITY 8DIP
LICAL-DEC-MS001
IC DECODER MS SERIES 20-SSOP
LICAL-ENC-MS001
IC ENCODER MS SERIES 20-SSOP
相关代理商/技术参数
KAD5512HP-21Q48
功能描述:模数转换器 - ADC 12-BIT 210MSPS HI PERF SINGLE ADC PROG
RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32
KAD5512HP-21Q72
功能描述:模数转换器 - ADC 12-BIT 210MSPS HI PERF SINGLE ADC PROG
RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32
KAD5512HP-25Q48
功能描述:模数转换器 - ADC 12-BIT 250MSPS HI PERF SINGLE ADC
RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32
KAD5512HP-25Q72
功能描述:模数转换器 - ADC 12-BIT 250MSPS HI PERF SINGLE ADC
RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32
KAD5512P
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Low Power 12-Bit, 250/210/170/125MSPS ADC
KAD5512P_09
制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:Low Power 12-Bit, 250/210/170/125MSPS ADC
KAD5512P-12Q48
功能描述:模数转换器 - ADC 12-BIT 125MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32
KAD5512P-12Q72
功能描述:模数转换器 - ADC 12-BIT 125MSPS SINGL ADC PROG LVDS/LVCMOS RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32